来源:
《信息技术与标准化》2006年第8期
作者:刘砚君(32)
稳态热阻对大功率晶体管寿命试验的影响
Influence on the Life Test of the Discrete Semiconductor Devices
from Steady State Thermal Resistance
摘要 在进行相关分立器件分析时发现,稳态热阻对功率器件寿命试验结果影响较大。本文通过相关案例分析,提出稳态热阻的变化量应作为功率器件寿命试验合格判据之一的建议。
关键词 热阻 稳态热阻 平均稳态热阻 峰值稳态热阻
Abstract The steady state thermal resistance has important influence on the life test by
researching the discrete semiconductor devices. This paper suggests that the change of
the steady state thermal resistance should become one of the criterions of the life test.
Keywords thermal resistance;steady state thermal resistance;mean steady state
thermal resistance;peak steady state thermal resistance.